Submicroscopic Structure Determination by Long Wavelength X‐Ray Diffraction
- Creators
- Henke, Burton L.
- DuMond, Jesse W. M.
Abstract
This paper reviews the theory of low angle x‐ray diffraction as applied in the long wavelength region for the determination of particle sizes and shapes and other structural features in the submicroscopic size range and emphasizes the advantages to be gained by employing the longer x‐ray wavelengths (8 to 25 A). It also is intended to serve as an introduction to a description of an entirely new instrumental technique developed for this long wavelength range utilizing a diffraction apparatus consisting of a special gas‐filled x‐ray tube and a total reflection camera in which the primary radiation is simultaneously monochromatized and made to converge to a point focus. The sample for study is placed in the converging part of the primary beam and the diffraction patterns are formed around the point focus on a photographic film.
Additional Information
© 1955 American Institute of Physics. Received May 3, 1954; revised version received February 14, 1955. This research was supported by funds from the Office of Naval Research and the U. S. Atomic Energy Commission. This work was the subject of the thesis of Burton L. Henke for his doctorate and is being extended as part of a soft x-ray research program at Pomona College under contract with the Office of Scientific Research (U. S. Air Force). We would like to acknowledge the invaluable assistance of Mr. Herbert Henrikson and Mr. Raymond Burt in the design and construction of the total reflection camera, and that of Mr. Theodore Garner in the later modification of this instrument.Attached Files
Published - 1.1722117.pdf
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Additional details
- Eprint ID
- 46415
- Resolver ID
- CaltechAUTHORS:20140621-121757299
- Air Force Office of Scientific Research (AFOSR)
- Atomic Energy Commission
- Created
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2014-06-23Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field