Published April 15, 1991
| public
Journal Article
Study of chemically-etched Bi_2Sr_(2−x)Ca_(1+x)Cu_2O_(8+δ) surfaces
- Creators
- Vasquez, R. P.
- Housley, R. M.
Abstract
X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) are used to characterize the surfaces of polycrystalline Bi_2Sr_(2−x)Ca_(1+x)Cu_2O_(8+δ) thin films which have been chemically etched in a solution of Br_2 in absolute ethanol. XPS measurements from individual grains (∼1 mm^2) are obtained, and the spectra presented here are comparable to spectra in the literature obtained from single crystals cleaved in vacuum. XPS valence band spectra show a clear Fermi edge, indicating that the room temperature conductivity near the surface is metallic. This is the first report of a detectable Fermi edge from a high temperature superconductor surface which has been treated in vacuum.
Additional Information
© 1991 Elsevier Science Publishers B.V. Received 14 December 1990. Revised manuscript received 14 February 1991. The surface studies described in this paper were performed by the Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, and were sponsored by the National Aeronautics and Space Administration (NASA), Office of Aeronautics and Space Technology, and also by the Defense Advanced Research Projects Agency and the Strategic Defense Initiative Organization, Innovative Science and Technology Office, through agreements with NASA. The film preparation and characterization were supported by the Rockwell International Independent Research and Development Fund.Additional details
- Eprint ID
- 45907
- Resolver ID
- CaltechAUTHORS:20140523-105812367
- Rockwell International Independent Research and Development Fund
- NASA
- Defense Advanced Research Projects Agency (DARPA)
- Strategic Defense Initiative Organization (SDIO)
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2014-05-27Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field