Published February 1986
| Published
Journal Article
Open
Low Energy X-Ray Spectra Measured with a Mercuric Iodide Energy Dispersive Spectrometer in a Scanning Electron Microscope
Chicago
Abstract
A mercuric iodide energy dispersive x-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-Kα at 5.9 keV and 195 eV (FWHM) for Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies.
Additional Information
© 1986 IEEE. Published: Feb. 1986. The authors wish to thank B. Dancy, F. Riquelme and P. Rohmer at USC and V. Taylor at JPL for valuable technical assistance. Research described in this paper was performed, in part, by Jet Propulsion Laboratory, California Institute of Technology under NASA Contract NAS 7-918. Fundamental HgI2 x-ray detector development at USC was supported by DOE Contract DE-AM03-76SF00113 and NASA Contract NSG-7535.Attached Files
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Additional details
- Eprint ID
- 41749
- Resolver ID
- CaltechAUTHORS:20131008-143821891
- NASA
- NAS 7-918
- Department of Energy (DOE)
- DE-AM03-76SF00113
- NASA
- NSG-7535
- Created
-
2013-10-08Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Caltech groups
- Division of Geological and Planetary Sciences