Time-Space Constrained Codes for Phase-Change Memories
- Creators
- Qin, Minghai
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Yaakobi, Eitan
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Siegel, Paul H.
Abstract
Phase-change memory (PCM) is a promising nonvolatile solid-state memory technology. A PCM cell stores data by using its amorphous and crystalline states. The cell changes between these two states using high temperature. However, since the cells are sensitive to high temperature, it is important, when programming cells (i.e., changing cell levels), to balance the heat both in time and in space. In this paper, we study the time-space constraint for PCM, which was originally proposed by Jiang and coworkers. A code is called an (α, β, p)- constrained code if for any α consecutive rewrites and for any segment of β contiguous cells, the total rewrite cost of the β cells over those α rewrites is at most p. Here, the cells are binary and the rewrite cost is defined to be the Hamming distance between the current and next memory states. First, we show a general upper bound on the achievable rate of these codes which extends the results of Jiang and coworkers. Then, we generalize their construction for (α ≥ 1, β = 1, p = 1)-constrained codes and show another construction for (α = 1, β ≥ 1, p ≥ 1)-constrained codes. Finally, we show that these two constructions can be used to construct codes for all values of α, β, and p.
Additional Information
© 2011 IEEE. Date of Publication: Aug. 2013. This work was supported in part by the University of California Lab Fees Research Program, Award No. 09-LR-06-118620-SIEP, the Center for Magnetic Recording Research at the University of California, San Diego, and the Intel Ph.d. Fellowship Program.Attached Files
Submitted - 1207.4530v1.pdf
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Additional details
- Eprint ID
- 41595
- DOI
- 10.1109/TIT.2013.2257916
- Resolver ID
- CaltechAUTHORS:20131001-154005275
- University of California Lab Fees Research Program Award
- 09-LR-06-118620-SIEP
- University of California San Diego, Center for Magnetic Recording Research
- Intel Ph.d Fellowship Program
- Created
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2013-10-02Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Other Numbering System Name
- INSPEC Accession Number:
- Other Numbering System Identifier
- 13655058