Published November 19, 2012
| Published
Journal Article
Open
Sideband spectroscopy and dispersion measurement in microcavities
Abstract
The measurement of dispersion and its control have become important considerations in nonlinear devices based on microcavities. A sideband technique is applied here to accurately measure dispersion in a microcavity resulting from both geometrical and material contributions. Moreover, by combining the method with finite element simulations, we show that mapping of spectral lines to their corresponding transverse mode families is possible. The method is applicable for high-Q, micro-cavities having microwave rate free spectral range and has a relative precision of 5.5 × 10^(−6) for a 2 mm disk cavity with FSR of 32.9382 GHz and Q of 150 million.
Additional Information
© 2012 Optical Society of America. Received 17 Sep 2012; revised 31 Oct 2012; accepted 1 Nov 2012; published 7 Nov 2012. The authors acknowledge the financial support from the DARPA QuASAR program, the Institute for Quantum Information and Matter, an NSF Physics Frontiers Center with support of the Gordon and Betty Moore Foundation, NASA and the Kavli Nano Science Institute.Attached Files
Published - oe-20-24-26337.pdf
Files
oe-20-24-26337.pdf
Files
(1.7 MB)
| Name | Size | Download all |
|---|---|---|
|
md5:2f0cff03ae18110da0025a6d72250df4
|
1.7 MB | Preview Download |
Additional details
- Eprint ID
- 36485
- Resolver ID
- CaltechAUTHORS:20130118-145853804
- Defense Advanced Research Projects Agency (DARPA)
- Institute for Quantum Information and Matter (IQIM)
- NSF Physics Frontiers Center
- Gordon and Betty Moore Foundation
- NASA
- Kavli Nanoscience Institute
- Created
-
2013-01-18Created from EPrint's datestamp field
- Updated
-
2021-11-09Created from EPrint's last_modified field
- Caltech groups
- Institute for Quantum Information and Matter, Kavli Nanoscience Institute