Published August 6, 2012
| Published
Journal Article
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Electron beam induced current in InSb-InAs nanowire type-III heterostructures
Chicago
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Abstract
InSb-InAs nanowire heterostructure diodes investigated by electron beam induced current (EBIC) demonstrate an unusual spatial profile where the sign of the EBIC signal changes in the vicinity of the heterointerface. A qualitative explanation confirmed by theoretical calculations is based on the specific band diagram of the structure representing a type-III heterojunction with an accumulation layer in InAs. The sign of the EBIC signal depends on the specific parameters of this layer. In the course of measurements, the diffusion length of holes in InAs and its temperature dependence are also determined.
Additional Information
© 2012 American Institute of Physics. Received 6 June 2012; accepted 30 July 2012; published online 9 August 2012. Authors C.Y.C., A.S., and H.E.R. gratefully acknowledge support for this work from NSERC, CIPI, CSA, and OCE. A.P. acknowledges funding from European Union through Marie Curie Actions under REA grant agreement 298861 (NEMO).Attached Files
Published - ApplPhysLett_101_063116.pdf
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ApplPhysLett_101_063116.pdf
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Additional details
- Eprint ID
- 35166
- Resolver ID
- CaltechAUTHORS:20121030-082951686
- Natural Sciences and Engineering Research Council of Canada (NSERC)
- CIPI
- CSA (Canada)
- Ontario Centres of Excellence (OCE)
- European Union Marie Curie
- 298861
- Created
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2012-10-30Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field