Published August 30, 2012
| Supplemental Material + Published
Journal Article
Open
Statistics of Dislocation Slip Avalanches in Nanosized Single Crystals Show Tuned Critical Behavior Predicted by a Simple Mean Field Model
Chicago
Abstract
We show that slowly sheared metallic nanocrystals deform via discrete strain bursts (slips), whose size distributions follow power laws with stress-dependent cutoffs. We show for the first time that plasticity reflects tuned criticality, by collapsing the stress-dependent slip-size distributions onto a predicted scaling function. Both power-law exponents and scaling function agree with mean-field theory predictions. Our study of 7 materials and 2 crystal structures, at various deformation rates, stresses, and crystal sizes down to 75 nm, attests to the universal characteristics of plasticity.
Additional Information
© 2012 American Physical Society. Received 6 December 2011; published 30 August 2012. We thank James Antonaglia, Braden Brinkman, Dennis Dimiduk, Tyler Earnest, Robert Maass, and Matthew Wraith for helpful conversations and acknowledge the financial support of NSERC (N. F.) and from grants NSF No. DMR 03-25939 ITR ("Materials Computation Center") and No. DMR 1005209 (G. T. and K. D.), as well as from NSF (A. T. J.), NSF CAREER Grant No. DMR-0748267 (J. R. G.), and ONR Grant No. N00014-09-1-0883 (J. R. G.). K. D. also thanks the Kavli Institute of Theoretical Physics at UC Santa Barbara for hospitality and support.Attached Files
Published - PhysRevLett.109.095507.pdf
Supplemental Material - README.TXT
Supplemental Material - SupportingMaterials-4-7-2.pdf
Files
SupportingMaterials-4-7-2.pdf
Additional details
- Eprint ID
- 34802
- Resolver ID
- CaltechAUTHORS:20121010-070312238
- Natural Sciences and Engineering Research Council of Canada (NSERC)
- NSF
- DMR 03-25939
- NSF
- DMR 1005209
- NSF
- DMR-0748267
- Office of Naval Research (ONR)
- N00014-09-1-0883
- Kavli Institute for Theoretical Physics in Santa Barbara
- Created
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2012-10-10Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field