Statistical analysis of Bragg reflectors
- Creators
- Shellan, J. B.
- Agmon, P.
- Yeh, P.
- Yariv, A.
Abstract
The effects on reflectivity of a statistical variation in the thickness of layers in a multilayered Bragg reflector are studied. Analytic expressions are obtained for 〈ρ〉 and 〈ρρ*〉, the expected value of the reflection and reflectivity coefficients as a function of σ, the standard deviation in layer thickness. These expressions are then compared with values obtained using a computer routine which "builds" a reflector with the desired parameters and σ value, and then calculates the reflection. The results of the computer experiment are presented in the form of p(ρρ*), the probability distribution function of a statistical Bragg reflector. Finally, simple phenomenological expressions are presented for the reflectivity probability distribution.
Additional Information
© 1978 Optical Society of America. Received 12 September 1977. Research supported by the NSF (Optical Communication Program) and the Air Force Office of Scientific Research. Fannie and John Hertz Foundation Doctoral Fellow.Attached Files
Published - SHEjosa78.pdf
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Additional details
- Eprint ID
- 32906
- Resolver ID
- CaltechAUTHORS:20120803-092240996
- NSF Optical Communication Program
- Air Force Office of Scientific Research (AFOSR)
- Fannie and John Hertz Foundation
- Created
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2012-08-03Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field