Published July 1979
| public
Journal Article
Quantitative interpretation of electron micrographs using image processing techniques
- Creators
- Horgen, H.
Abstract
Several different techniques for enhancing the contrast of electron micrographs or for extracting latent information with the aid of a computer are described. Enhancement of lattice-fringe images and of the weak-beam image of a dislocation dipole demonstrate a way to match experimental results with theoretical contrast predictions. Problems associated with the restoration of a weakly-scattering specimen imaged in bright-field are illustrated on focal series of catalase and of small gold clusters on a carbon substrate.
Additional Information
© 1979 Institute of Physics. Manuscript received in February 17, 1979. I wish to thank my adviser, R. E. Villagrana, for his unfailing support during the course of this research, and D. M. Maher for the provision of the weak-beam micrographs.Additional details
- Eprint ID
- 32784
- DOI
- 10.1088/0150-536X/10/4/002
- Resolver ID
- CaltechAUTHORS:20120730-095433260
- Created
-
2012-07-30Created from EPrint's datestamp field
- Updated
-
2022-07-12Created from EPrint's last_modified field