Published April 15, 1989
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Journal Article
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Temperature‐dependent transmission extended electron energy‐loss fine structure of aluminum
Abstract
Inelastic electron scattering experiments in a transmission electron microscope provide a probe of core electron excitations that have binding energies below 2 keV, and that are localized within submicron diameter sample volumes. Extended electron energy‐loss fine‐structure measurements which show the variation with temperature of the mean squared relative displacement of aluminum yield a localized measurement of the Debye temperature which is in excellent agreement with macroscopic measurements.
Additional Information
© 1989 American Institute of Physics. Received 28 July 1988; accepted for publication 22 December 1988. We would like to acknowledge Carl Klein for preparation of the aluminum foils, Arizona State University for use of the Philips EM430 electron microscope, G. H. Via for useful discussion, and K. Drake for software assistance.Attached Files
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