Quantitative surface normal measurement by a wavefront camera
- Creators
- Ren, Jian
- Cui, Xiquan
- Lee, Lap Man
- Yang, Changhuei
Abstract
A compact wavefront camera that allows users to quantitatively measure the intensity and wavefront at a remote object plane is reported. The camera is built from a chip-scale wavefront sensor that we previously developed. By measuring the wavefront of the image and calibrating the wavefront relationship between the image and object planes, the wavefront at the object plane can be computed and the surface normal of the object can be derived. We built a prototype camera and calibrated the wavefront relationship. In a proof-of-concept experiment, a set of concave mirrors with different focal lengths (50–200 mm), were imaged. The results agree well with their expected values. To demonstrate the application of the camera, we applied this method to measure the deformation of a microfluidic channel under pressure.
Additional Information
© 2012 Optical Society of America. Received October 6, 2011; revised November 21, 2011; accepted November 22, 2011; posted November 28, 2011 (Doc. ID 155731); published January 12, 2012. The authors acknowledge Jigang Wu, George Rakuljic, and Guoan Zheng for helpful discussion. This work was supported by the Wallace Coulter Foundation, National Science Foundation (NSF) career award BES-0547657, and the National Institutes of Health (NIH) R21EB008867.Attached Files
Published - Ren2012p17263Opt_Lett.pdf
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Additional details
- Eprint ID
- 29466
- Resolver ID
- CaltechAUTHORS:20120224-151606385
- Wallace Coulter Foundation
- BES-0547657
- NSF
- R21EB008867
- NIH
- Created
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2012-02-24Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field