Published January 10, 2012
| public
Journal Article
Enhancing image contrast and slicing electron pulses in 4D near field electron microscopy
- Creators
- Park, Sang Tae
- Zewail, Ahmed H.
Abstract
In this Letter, we discuss the use of photon-induced near field electron microscopy (PINEM) to reach new limits of temporal and spatial resolutions. We invoke two optical femtosecond pulses, one of them is for the usual clocking of dynamical change but the second one is for gating (slicing) the imaging-electron continuous or pulsed beam. It is shown that in both cases the resolution becomes that of the optical gating pulse and not of the electron one. We also show that by using the near field of a nanoparticle it is possible to enhance contrast in imaging of materials and including biological structures.
Additional Information
© 2011 Elsevier B.V. Available online 22 November 2011. This work was supported by the National Science Foundation and the Air Force Office of Scientific Research in the Center for Physical Biology funded by the Gordon and Betty Moore Foundation.Additional details
- Eprint ID
- 29161
- DOI
- 10.1016/j.cplett.2011.11.031
- Resolver ID
- CaltechAUTHORS:20120207-075729956
- NSF
- Air Force Office of Scientific Research (AFOSR)
- Gordon and Betty Moore Foundation
- Created
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2012-02-07Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field