Mechanical response of multicrystalline thin films in mesoscale field dislocation mechanics
- Creators
- Puri, Saurabh
- Das, Amit
- Acharya, Amit
Abstract
A continuum model of plasticity, Phenomenological Mesoscopic Field Dislocation Mechanics (PMFDM), is used to study the effect of surface passivation, grain orientation, grain boundary constraints, and film thickness on the mechanical response of multicrystalline thin films. The numerical experiments presented in this paper show that a surface passivation layer on thin films introduces thickness dependence of the mechanical response. However, the effect of passivation decreases in films with impenetrable grain boundaries. The orientation of individual grains of the multicrystal also has a significant effect on the mechanical response. Our results are in qualitative agreement with experimental observations. A primary contribution of this work is the implementation of a jump condition that enables the modeling of important limits of grain boundary constraints to plastic flow, independent of ad-hoc constitutive assumptions and interface conditions.
Additional Information
© 2011 Elsevier Ltd. Received 6 September 2010; revised 14 June 2011; Accepted 15 June 2011. Available online 31 August 2011. Support from the National Science Foundation (Grant nos: DMI-0423304, DMR-0520425 CMU MRSEC), the US-ONR (Grant no. N000140910301), and the CMU Dowd-ICES Fellowship to SP is gratefully acknowledged.Additional details
- Eprint ID
- 27753
- DOI
- 10.1016/j.jmps.2011.06.009
- Resolver ID
- CaltechAUTHORS:20111111-132318989
- DMI-0423304
- NSF
- DMR-0520425 CMU MRSEC
- NSF
- N000140910301
- Office of Naval Research (ONR)
- CMU Dowd-ICES Fellowship
- Created
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2011-11-18Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field