Advanced gem characterization

Abstract

As clever minds combine an ever-increasing menu of high-tech methods in the quest to enhance the properties of both natural and synthetic gems, the challenges of gem characterization continue to grow rapidly. Gemology has adopted new methods to keep pace. Techniques considered advanced a decade ago-such as infrared, Raman, X-ray fluorescence, and photoluminescence spectroscopy, as well as LA-ICP-MS-are now routine analytical tools in well-equipped gemological laboratories. Trace-element analyses at the parts per million level are now at the forefront of determining locality of origin and treatments. New methods now being used in academic and industrial laboratories will become increasingly important in gemological labs as the technology applied to gem treatments rapidly advances.

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