Published June 2011
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Journal Article
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A high temperature apparatus for measurement of the Seebeck coefficient
Abstract
A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.
Additional Information
© 2011 American Institute of Physics. Received 18 March 2011; accepted 25 May 2011; published online 30 June 2011. The authors thank Danny Zoltan and funding by NASA-JPL, and ARPA-E.Attached Files
Published - Iwanaga2011p15148Review_of_Scientific_Instruments.pdf
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Iwanaga2011p15148Review_of_Scientific_Instruments.pdf
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Additional details
- Eprint ID
- 24508
- Resolver ID
- CaltechAUTHORS:20110722-112516836
- NASA/JPL
- ARPA-E
- Created
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2011-10-14Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field