Published September 2007
| Published
Book Section - Chapter
Open
mm-Wave Silicon ICs: Challenges and Opportunities
- Creators
-
Hajimiri, Ali
Chicago
Abstract
Millimeter-waves offer promising opportunities and interesting challenges to silicon integrated circuit and system designers. These challenges go beyond standard circuit design questions and span a broader range of topics including wave propagation, antenna design, and communication channel capacity limits. It is only meaningful to evaluate the benefits and shortcoming of silicon-based mm-wave integrated circuits in this broader context. This paper reviews some of these issues and presents several solutions to them.
Additional Information
© 2007 IEEE. Issue Date: 16-19 Sept. 2007; Date of Current Version: 21 January 2008. The author would like to thank the contributions of A. Babakhani, A. Natarajan, Y. Wang, and H. Wang of Caltech and Dr. A. Komijani, Dr. X. Guan, Prof. H. Hashemi, Prof. J. Buckwalter formerly of Caltech for the numerous contribution to Caltech's mm-wave activity. The authors also would like to thank E. Keehr, F. Bohn, and A. Babakhani for helpful comments on this manuscript. We have benefitted from the support of Caltech's Lee Center for Advance Networking, National Science Foundation, and DARPA Trusted Foundry Program.Attached Files
Published - Hajimiri2007p8523Proceedings_Of_The_Ieee_2007_Custom_Integrated_Circuits_Conference.pdf
Files
Hajimiri2007p8523Proceedings_Of_The_Ieee_2007_Custom_Integrated_Circuits_Conference.pdf
Files
(1.8 MB)
Name | Size | Download all |
---|---|---|
md5:c9231b8fd9537644c2a6288484701de0
|
1.8 MB | Preview Download |
Additional details
- Eprint ID
- 19868
- Resolver ID
- CaltechAUTHORS:20100910-112239498
- Caltech Lee Center for Advanced Networking
- NSF
- Defense Advanced Research Projects Agency (DARPA) Trusted Foundry Program
- Created
-
2010-09-10Created from EPrint's datestamp field
- Updated
-
2021-11-08Created from EPrint's last_modified field
- Series Name
- IEEE Custom Integrated Circuits Conference
- Other Numbering System Name
- INSPEC Accession Number
- Other Numbering System Identifier
- 9811011