Published March 8, 2010
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Journal Article
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Thin film dielectric microstrip kinetic inductance detectors
Chicago
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Abstract
Microwave kinetic inductance detectors, or MKIDs, are a type of low temperature detector that exhibit intrinsic frequency domain multiplexing at microwave frequencies. We present the first theory and measurements on a MKID based on a microstrip transmission line resonator. A complete characterization of the dielectric loss and noise properties of these resonators is performed, and agrees well with the derived theory. A competitive noise equivalent power of 5×10^(−17) W Hz^(−1/2) at 10 Hz has been demonstrated. The resonators exhibit the highest quality factors known in a microstrip resonator with a deposited thin film dielectric.
Additional Information
© 2010 American Institute of Physics. Received 7 October 2009; accepted 21 January 2010; published online 8 March 2010. This material is based upon work supported by the National Aeronautics and Space Administration under Grant No. NNH06ZDA001N-APRA2 issued through the Science Mission Directorate. The authors would like to thank John Martinis, Sunil Golwala, and Andrew Cleland for useful insights.Attached Files
Published - Mazin2010p7432Appl_Phys_Lett.pdf
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Mazin2010p7432Appl_Phys_Lett.pdf
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Additional details
- Eprint ID
- 17890
- Resolver ID
- CaltechAUTHORS:20100407-135514104
- NASA
- NNH06ZDA001N-APRA2
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2010-04-22Created from EPrint's datestamp field
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2021-11-08Created from EPrint's last_modified field