Narrow linewidth, single frequency semiconductor laser with a phase conjugate external cavity mirror

Abstract

We measure the spectral characteristics of an external cavity semiconductor laser which uses a phase conjugate mirror for its external reflection. This device has significant advantages over the conventional external cavity system owing to the self-aligning nature of the phase conjugate mirror. The fiber delay line self-heterodyne technique is used to measure the fundamental linewidth for single mode operation of this device. It shows the linewidth to be at least as narrow as the instrumental resolution of 100 kHz.

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