Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots
Abstract
Optical characterization of AlGaAs microdisk resonant cavities with a quantum dot active region is presented. Direct passive measurement of the optical loss within AlGaAs microdisk resonant structures embedded with InAs/InGaAs dots-in-a-well (DWELL) is performed using an optical-fiber-based probing technique at a wavelength (λ ~ 1.4 μm) that is red detuned from the dot emission wavelength (λ ~ 1.2 μm). Measurements in the 1.4 μm wavelength band on microdisks of diameter D=4.5 μm show that these structures support modes with cold-cavity quality factors as high as 3.6 x 10^(5). DWELL-containing microdisks are then studied through optical pumping at room temperature. Pulsed lasing at λ ~ 1.2 μm is seen for cavities containing a single layer of InAs dots, with threshold values of ~ 17 μW, approaching the estimated material transparency level. Room-temperature continuous-wave operation is also observed.
Additional Information
© 2005 American Institute of Physics. Received 16 December 2004; accepted 28 February 2005; published online 6 April 2005. One of the authors (K.S.) thanks K. Hennessy for helpful conversations regarding AlGaAs processing. Three of the authors (K.S., T.J., and M.B.), respectively, thank the Hertz Foundation, the Charles Lee Powell Foundation, and the Moore Foundation, NPSC, and HRL Laboratories for their graduate fellowship support.Attached Files
Published - SRIapl05.pdf
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Additional details
- Eprint ID
- 2277
- Resolver ID
- CaltechAUTHORS:SRIapl05
- Fannie and John Hertz Foundation
- Charles Lee Powell Foundation
- Gordon and Betty Moore Foundation
- National Physical Science Consortium
- Hughes Research Laboratories
- Created
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2006-03-21Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field