Published November 27, 2006
| Published
Journal Article
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Position sensitive x-ray spectrophotometer using microwave kinetic inductance detectors
Abstract
The surface impedance of a superconductor changes when energy is absorbed and Cooper pairs are broken to produce single electron (quasiparticle) excitations. This change may be sensitively measured using a thin-film resonant circuit called a microwave kinetic inductance detector (MKID). The practical application of MKIDs for photon detection requires a method of efficiently coupling the photon energy to the MKID. The authors present results on position sensitive x-ray detectors made by using two aluminum MKIDs on either side of a tantalum photon absorber strip. Diffusion constants, recombination times, and energy resolution are reported. MKIDs can easily be scaled into large arrays.
Additional Information
© 2006 American Institute of Physics (Received 30 August 2006; accepted 5 October 2006; published online 29 November 2006) The research described in this letter was carried out at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration. This work was supported in part by JPL Research and Technology Development funds and by NASA Grant No. NAG5-5322 to one of the authors (F.A.H.). The authors would like to thank Rick LeDuc, Jiansong Gao, Dan Prober, and Luigi Frunzio for useful discussions.Attached Files
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Additional details
- Eprint ID
- 6414
- Resolver ID
- CaltechAUTHORS:MAZapl06
- NASA/JPL/Caltech
- JPL Research and Technology Development Fund
- NAG5-5322
- NASA
- Created
-
2006-12-07Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field
- Caltech groups
- Space Radiation Laboratory