Submicron Deformation Field Measurements II: Improved Digital Image Correlation

Abstract

This is the second paper in a series of three devoted to the applicaiton of Scanning Tunneling Microscopy to mechanics problems. In this paper improvements to the Digital Image Correlation method are outlined, a technique that compares digital images of a specimen surface before and after deformation to deduce its (2-D) surface displacement field and strains. The necessity of using the framework of large deformation theory for accurately addressing rigid body rotations to reduce associated errors in the strain components is pointed out. In addition, the algorithm is extended to compute the three-dimensional surface displacement field from Scanning Tunneling Microscope data; also, significant improvements are achieved in the rate as well as the robustness of the convergence. For Scanning Tunneling Microscopy topographs the resolution yields 4.8 nm for the in-plane and 1.5 nm for the out-of-plane displacement components spanning an area of 10 μm x 10 μm.

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