Published January 3, 2005
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Journal Article
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X-ray high-resolution diffraction using refractive lenses
Abstract
Refractive x-ray lenses have recently been applied for imaging and scanning microscopy with hard x rays. We report the application of refractive lenses in an optical scheme for high-resolution x-ray diffraction, performed at a high brilliance synchrotron radiation source. An experimental proof of principle and a theoretical discussion are presented. In particular, we observe the x-ray diffraction pattern from a two-dimensional photonic crystal with 4.2 µm periodicity, which normally is employed to scatter light in the infrared.
Additional Information
©2005 American Institute of Physics (Received 21 July 2004; accepted 1 November 2004; published online 23 December 2004) The authors would like to thank R. Rueffer, A. Chumakov, O. Leupold, and J.-P. Celse from beamline ID18 for their excellent support. As well, they appreciate Viktor Kohn's critical remarks during the preparation of the manuscript.Files
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- CaltechAUTHORS:DRAapl05
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2006-04-24Created from EPrint's datestamp field
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2021-11-08Created from EPrint's last_modified field