Published September 1, 2008
| Published
Journal Article
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Quantitative differential interference contrast microscopy based on structured-aperture interference
- Creators
- Cui, Xiquan
- Lew, Matthew
-
Yang, Changhuei
Abstract
We report a quantitative differential interference contrast (DIC) microscope based on a structured-aperture (SA) wavefront sensor. Unlike a conventional DIC microscope, the SA-DIC microscope can separate the amplitude and the phase gradient information of the image wavefront, and form quantitative intensity and DIC images of the sample with good resolution; our prototype achieved resolution ~2 µm. Furthermore, due to the nonpolarization nature of the microscope, we were able to image birefringent samples without artifacts.
Additional Information
© 2008 American Institute of Physics. Received 21 May 2008; accepted 11 August 2008; published 4 September 2008. The authors acknowledge financial support from the Defense Advanced Research Projects Agency Center for Optofluidic Integration. We thank Professor Paul Sternberg, Dr. Ying Zhou, Jigang Wu, Guoan Zheng, and Emily McDowell for their technical assistance and enlightening discussions.Attached Files
Published - CUIapl08.pdf
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Additional details
- Eprint ID
- 11586
- Resolver ID
- CaltechAUTHORS:CUIapl08
- Defense Advanced Research Projects Agency (DARPA)
- Created
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2008-09-08Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field