Lateral forces during atomic force microscopy of graphite in air
- Creators
- Baselt, David R.
- Baldeschwieler, John D.
Abstract
Highly oriented pyrolytic graphite and boronated pyrolytic graphite were imaged in air by simultaneous normal and lateral force microscopy. A number of effects occurred when scanning over steps, including an increase in attractive forces from surface contamination which could be detrimental to the imaging of soft or weakly bonded samples. Contamination may also give rise to regions of high lateral force which do not seem to be associated with any topographic features. Finally, in atomic resolution images of graphite, atomic corrugation was clearer in the lateral cantilever deflection images than in the simultaneous topography and normal cantilever deflection images, demonstrating the high sensitivity of lateral force detection to topographic features.
Additional Information
© 1992 American Vacuum Society. (Received 4 February 1992; accepted 7 July 1992) The authors thank Topometrix for the use of their electronics and A. W. Moore for supplying the boronated graphite. This work was supported by a grant from Ford Motor Company and a fellowship from the National Science Foundation.Files
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Additional details
- Eprint ID
- 2327
- Resolver ID
- CaltechAUTHORS:BASjvstb92
- Created
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2006-03-27Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field