Published October 20, 2004
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Science and instrumentation update from the Palomar testbed interferometer
- Creators
- Boden, A.
- Other:
- Traub, Wesley A.
Abstract
The Palomar Testbed Interferometer (PTI) is a near-infrared, long-baseline interferometer located at the Palomar Observatory. PTI obtained first fringes in 1995, and has been in routine scientific operations since 1998. PTI was primarily designed as a technology demonstration experiment for the Keck Interferometer, and has been successful in demonstrating 100-uas-class differential astrometry and two-combiner phase referencing. In addition to its engineering development accomplishments, PTI has been extraordinarily scientifically productive, producing more than 25 refereed scientific papers to date. This contribution will provide an update on PTI's operational, technical, and scientific status.
Additional Information
© 2004 Society of Photo-Optical Instrumentation Engineers (SPIE). The author gratefully acknowledges the greater PTI Collaboration for support and camaraderie over the past eight years. In particular it is appropriate to acknowledge Mike Shao and Mark Colavita, who had the vision and fortitude to bring PTI into existence. The collaboration also gratefully acknowledges the invaluable contributions of our professional observer Kevin Rykoski. PTI is administered by the Michelson Science Center, and the collaboration acknowledges the continuing support of MSC Directors past and present. Finally, the PTI Collaboration gratefully acknowledges the support of NASA in the development and operations of PTI. This work has made use of services from the Michelson Science Center, California Institute of Technology, http://msc.caltech.edu. This work has also made use of the SIMBAD database, operated at CDS, Strasbourg, France.Attached Files
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Additional details
- Eprint ID
- 93137
- Resolver ID
- CaltechAUTHORS:20190221-110526962
- NASA
- Created
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2019-02-25Created from EPrint's datestamp field
- Updated
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2021-11-16Created from EPrint's last_modified field
- Caltech groups
- Infrared Processing and Analysis Center (IPAC)
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 5491