Differential phase technique with the Keck Interferometer
- Others:
- Lena, Pierre J.
- Quirrenbach, Andreas
Abstract
We present the motivation and development of the novel `differential phase' technique being developed for the Keck Interferometer with the goal of detecting faint companions near a bright source. The differential phase technique uses simultaneous phase measurements at several infrared wavelengths to detect the astrophysical signature produced by a chromatic, asymmetric brightness distribution. We discuss the origin of the differential phase signature and present results of test observations taken at the Palomar Testbed Interferometer. One important test result is the larger than expected effect of water vapor turbulence on these multi-wavelength observations due to the infrared dispersion of water. In order to reach the design goal of 0.1 milliradians, the phase noise caused by both temperature and water vapor fluctuations in the atmosphere must be corrected, and we discuss several ways to achieve this.
Additional Information
© 2000 Society of Photo-Optical Instrumentation Engineers (SPIE). This work was performed at the Infrared Processing and Analysis Center, California Institute of Technology and the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration. Interferometer data were obtained at Palomar Observatory using the NASA Palomar Testbed Interferometer supported by NASA contracts to the Jet Propulsion Laboratory and observations at PTI are made possible through the efforts of the PTI Collaboration (http : //huey.jpl.nasa.gov/palomar/ptimembers.html). Funding for the Keck Interferometer provided by the National Aeronautics and Space Administration.Attached Files
Published - 321.pdf
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Additional details
- Eprint ID
- 91460
- Resolver ID
- CaltechAUTHORS:20181204-132723256
- NASA/JPL/Caltech
- Created
-
2018-12-06Created from EPrint's datestamp field
- Updated
-
2021-11-16Created from EPrint's last_modified field
- Caltech groups
- Infrared Processing and Analysis Center (IPAC)
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 4006