Spin-dressed relaxation and frequency shifts from field imperfections
- Creators
- Swank, C. M.
- Webb, E. K.
- Liu, X.
- Filippone, B. W.
Abstract
Critical dressing, the simultaneous dressing of two spin species to the same effective Larmor frequency, is a technique that can, in principle, improve the sensitivity to small frequency shifts. The benefits of spin dressing and thus critical dressing are achieved at the expense of generating a large (relative to the holding field B_0,) homogeneous oscillating field. Due to inevitable imperfections of the fields generated, the benefits of spin dressing may be lost from the additional relaxation and noise generated by the dressing field imperfections. In this analysis, the subject of relaxation and frequency shifts are approached with simulations and theory. Analytical predictions are made from a new quasiquantum model that includes gradients in the holding field B_0 = ω_0/γ and dressing field B_1 = ω_1/γ where B_1 is oscillating at frequency ω. It is found that irreversible DC gradient relaxation can be canceled by an AC spin-dressing gradient in the Redfield regime. Furthermore, it is shown that there is no linear in E frequency shift generated by gradients in the dressing field. The results are compared with a Monte Carlo simulation coupled with a fifth-order Runge-Kutta integrator. Comparisons of the two methods are presented as well as a set of optimized parameters that produce stable critical dressing for a range of oscillating frequencies ω, as well as pulsed frequency modulation parameters for maximum sensitivity.
Additional Information
© 2018 American Physical Society. Received 1 September 2018; published 14 November 2018. C.M.S. thanks Robert Golub for his discussions and insight into the problem. This work was supported by the National Science Foundation Grants No. NSF-1506459 and No. NSF-1812340.Attached Files
Published - PhysRevA.98.053414.pdf
Submitted - 1808.09580.pdf
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Additional details
- Eprint ID
- 90918
- Resolver ID
- CaltechAUTHORS:20181115-111549950
- PHY-1506459
- NSF
- PHY-1812340
- NSF
- Created
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2018-11-15Created from EPrint's datestamp field
- Updated
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2021-11-16Created from EPrint's last_modified field