Local Electronic Structure of Single-Walled Carbon Nanotubes from Electrostatic Force Microscopy
- Creators
- Heo, Jinseong
- Bockrath, Marc
Abstract
An atomic force microscope was used to locally perturb and detect the charge density in carbon nanotubes. Changing the tip voltage varied the Fermi level in the nanotube. The local charge density increased abruptly whenever the Fermi level was swept through a van Hove singularity in the density of states, thereby coupling the cantilever's mechanical oscillations to the nanotube's local electronic properties. By using our technique to measure the local band gap of an intratube quantum-well structure, created by a nonuniform uniaxial strain, we have estimated the nanotube chiral angle. Our technique does not require attached electrodes or a specialized substrate, yielding a unique high-resolution spectroscopic tool that facilitates the comparison between local electronic structure of nanomaterials and further transport, optical, or sensing experiments.
Additional Information
© 2005 American Chemical Society. Received 27 January 2005. Published online 29 April 2005. Published in print 1 May 2005. We thank C. N. Lau for helpful discussions. Supported by Arrowhead Research Corporation and the Charles Lee Powell Foundation.Additional details
- Eprint ID
- 79827
- Resolver ID
- CaltechAUTHORS:20170807-071415310
- Arrowhead Research Corporation
- Charles Lee Powell Foundation
- Created
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2017-08-07Created from EPrint's datestamp field
- Updated
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2021-11-15Created from EPrint's last_modified field