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Published May 15, 2015 | Published
Journal Article Open

Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy

Abstract

The energy-band relations and electronic properties for the light absorber/protection-layer stack of TiO_2-stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential (operando), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.

Additional Information

© 2015 ECS - The Electrochemical Society. This work was supported through the Office of Science of the U.S. Department of Energy (DOE) under award no. DE SC0004993 to the Joint Center for Artificial Photosynthesis, a DOE Energy Innovation Hub. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE AC02 05CH11231. We acknowledge Dr. Philip Ross for contributions to the conceptual development of the AP-PES end station and experimental design. We acknowledge Fadl Saadi, Beomgyun Jeong, and Sana Rani for assistance during data collection at the beamline, Ravishankar Sundararaman for helpful discussions and assistance with theory, and Joseph A. Beardslee for assistance in XPS data collection.

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August 20, 2023
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October 23, 2023