Welcome to the new version of CaltechAUTHORS. Login is currently restricted to library staff. If you notice any issues, please email coda@library.caltech.edu
Published August 15, 2009 | Published
Journal Article Open

Step-step interaction on vicinal Si(001) surfaces studied by scanning tunneling microscopy

Abstract

We report on measurements of step-step interaction on a flat Si(111)−(7×7) surface and on vicinal Si(001) surfaces with miscut angles ranging between 0.2° and 8°. Starting from scanning tunneling microscopy images of these surfaces and describing steps profile and interactions by the continuum step model, we measured the self-correlation function of single steps and the distribution of terrace widths. Empirical parameters, such as step stiffness and step-step interaction strength, were evaluated from the images. The present experiment allows to assess the dependence of the step-step repulsion on miscut angle, showing how parameters drawn from tunneling images can be used to interpolate between continuum mesoscopic models and atomistic calculations of vicinal surfaces.

Additional Information

© 2009 American Physical Society. Received 18 May 2009; revised manuscript received 15 July 2009; published 21 August 2009.

Attached Files

Published - PhysRevB.80.075315.pdf

Files

PhysRevB.80.075315.pdf
Files (432.4 kB)
Name Size Download all
md5:27d87892bc3dd3b4a1598e5361e63c5f
432.4 kB Preview Download

Additional details

Created:
August 20, 2023
Modified:
October 24, 2023