Pulse Characteristic Display for Tunnel Emission Devices

Abstract

Recent studies on tunnel emission devices have demonstrated that destruction normally occurs because of high temperature generated within the thin film structure while their electrical characteristics are being measured. This difficulty has been overcome to a large degree by pulse tests performed with the unit described here. The most useful data to be observed on devices designed to emit electrons into a vacuum are: (a) the voltampere characteristic of the diode (metal-insulator-metal structure), and (b) the transfer characteristic (i.e., emitted current vs diode current).

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