Three-color resonance ionization spectroscopy of Zr in Si
Abstract
It has been proposed that the composition of the solar wind could be measured directly by transporting ultrapure collectors into space, exposing them to the solar wind, and returning them to earth for analysis. In a study to help assess the applicability of present and future postionization secondary neutral mass spectrometers for measuring solar wind implanted samples, measurements of Zr in Si were performed. A three-color resonant ionization scheme proved to be efficient while producing a background count rate limited by secondary ion signal (5×10^(−4) counts/laser pulse). This lowered the detection limit for these measurements to below 500 ppt for 450,000 averages. Unexpectedly, the Zr concentration in the Si was measured to be over 4 ppb, well above the detection limit of the analysis. This high concentration is thought to result from contamination during sample preparation, since a series of tests were performed that rule out memory effects during the analysis.
Additional Information
© 1997 American Institute of Physics. This work is supported by the U.S. Department of Energy, BES-Material Sciences, under Contract W-31-109-ENG-38 and by NASA Grant NAGW-4182.Attached Files
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Additional details
- Eprint ID
- 57257
- Resolver ID
- CaltechAUTHORS:20150506-085605768
- W-31-109-ENG-38
- Department of Energy (DOE)
- NAGW-4182
- NASA
- Created
-
2015-05-06Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Caltech groups
- Division of Geological and Planetary Sciences
- Series Name
- AIP conference proceedings
- Series Volume or Issue Number
- 388