Published November 1969
| public
Journal Article
Basal Dislocation Density Measurements in Zinc
- Creators
- Pope, D. P.
- Vreeland, T., Jr.
Abstract
Observations of dislocations in zinc using Berg-Barrett X-ray micrography confirm the validity of a dislocation etch for {1010} surfaces. A technique for measurement of the depth in which dislocations can be imaged in X-ray micrographs is given. This depth on (0001) surfaces of zinc was found to be 2.5 µ using a (1013) reflection and CoKα radiation.
Additional Information
© 1969 American Institute of Mining, Metallurgical, and Petroleum Engineers. Manuscript submitted April 14, 1969. This work was sponsored by the U.S. Atomic Energy Commission.Additional details
- Eprint ID
- 55518
- Resolver ID
- CaltechAUTHORS:20150304-124225961
- Atomic Energy Commission
- Created
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2015-03-04Created from EPrint's datestamp field
- Updated
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2019-10-03Created from EPrint's last_modified field