Published July 1968
| Published + Submitted
Journal Article
Open
Experimental techniques for observing dislocations by the Berg-Barrett method
- Creators
- Turner, A. P. L.
- Vreeland, T., Jr.
- Pope, D. P.
Abstract
Experimental problems in the application of the Berg-Barrett Method to the observation of dislocations in metal single crystals are discussed. The problem of background noise caused by fluorescence from the specimen and inelastic scattering is considered. A criterion for selecting an appropriate filter to discriminate against the background noise is presented. The problem of multiple images is discussed and a scheme for selecting diffraction geometry to eliminate unwanted images is presented. A detailed description of the relatively simple equipment used in Berg-Barrett work is given.
Additional Information
© 1968 International Union of Crystallography. Received 30 October 1967. The work reported herein was sponsored by the U.S. Atomic Energy Commission under Contract AT(04-3)-473. Dr R.C. Blish II, and Mr Jeffrey A. Gorman kindly supplied the B-B plates showing slip bands in Zn and dislocations in Al. Discussions with Professor D.S. Wood during the initial stages of this study were very helpful. A.P.L. Turner wishes to express his thanks to the Fannie and John Hertz Foundation for fellowship support during the course of this work. CALT-473-22.Attached Files
Published - a05932.pdf
Submitted - Experimental_Techniques_for_Observing_Dislocations....pdf
Files
Experimental_Techniques_for_Observing_Dislocations....pdf
Files
(5.5 MB)
Name | Size | Download all |
---|---|---|
md5:b0143e31fb2e037e601c4d51277d493e
|
2.8 MB | Preview Download |
md5:b0cb1e419ffcbebab67ed1b502a97e28
|
2.7 MB | Preview Download |
Additional details
- Eprint ID
- 54726
- Resolver ID
- CaltechAUTHORS:20150211-121937186
- AT(04-3)-473
- Atomic Energy Commission
- Created
-
2015-02-11Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Other Numbering System Name
- CALT
- Other Numbering System Identifier
- 473-22