The Mobility of Edge Dislocations in Pure Copper Single Crystals
- Creators
- Jassby, K. M.
- Vreeland, T., Jr.
Abstract
The velocity of selectively introduced edge dislocations in 99.999 percent pure copper crystals has been measured as a function of stress at temperatures from 66°K to 373°K by means of the torsion technique developed by Pope, Vreeland, and Wood (1967). The range of resolved shear stress was 0 to 15 megadynes/cm^2 for seven temperatures (66°K, 74°K, 83°K, 123°K, 173°K, 296°K, 373°K). The path of motion of individually displaced dislocations was traced from Berg-Barrett x-ray micrographs, while the etch pit technique was used to indicate the crossing of forest dislocations. The test crystals were free from substructure with a grown-in dislocation density between 10^3 and 10^4 cm/cm^3. The dislocations were between 0.01 and 0.02 cm in length and displacements varied between 0 and 0.1 cm, so that in the extreme case the intersection of forest dislocations was reduced to zero.
Additional Information
This work was sponsored by the U.S. Atomic Energy Commission. To be presented at the International Conference on The Quantitative Relation Between Properties and Microstructure, Haifa, Israel, July 27, 1969. CALT-767-P3-5.Attached Files
Submitted - The_Mobility_of_Edge_Dislocations....pdf
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Additional details
- Eprint ID
- 54715
- Resolver ID
- CaltechAUTHORS:20150211-103245777
- Created
-
2015-02-11Created from EPrint's datestamp field
- Updated
-
2019-10-03Created from EPrint's last_modified field
- Other Numbering System Name
- CALT
- Other Numbering System Identifier
- 767-P3-5