The depth distribution of hydrogen in lunar materials
- Creators
- Leich, D. A.
- Tombrello, T. A.
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Burnett, D. S.
Abstract
A technique employing the resonant nuclear reaction ^1H(^(19)F, αγ) ^(16)O has been used to measure hydrogen concentration versus depth in selected coarse fine fragments from the Apollo 11 and Apollo 15 missions, and in glass coated surface chips from two Apollo 15 rocks. The highly variable hydrogen content in the coarse fine fragments is concentrated mainly in a layer extending from the surface to a depth of 2000 ± 500A˚. The hydrogen content of the surface region of the Apollo 15 rock chips is comparable to that of the coarse fine samples, but is concentrated mainly within a few hundred angstroms of the surface. The hydrogen depth distribution in a piece of platinum foil from the Apollo 16 Lunar surface Cosmic Ray Experiment was also measured in an attempt to place a limit on the flux of 10–40 keV protons associated with a solar flare event.
Additional Information
© 1973 Published by Elsevier B.V. Received 22 March 1973; Revised version received 8 May 1973. Supported in part by the National Science Foundation [GP-28027]. We are grateful to Professors S Epstein, H P Taylor, Jr and G J Wasserburg for the use of their facilities and for many helpful discussions. The Apollo 16 Pt foil was graciously supplied by R M Walker. A Albee provided the chlorite standard. The lunar samples used in this work were allocated to Professor Wasserburg under NASA contract NGL 05-002-188.Additional details
- Eprint ID
- 53104
- Resolver ID
- CaltechAUTHORS:20141222-133711484
- NGL 05-002-188
- NASA
- GP-28027
- NSF
- Created
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2014-12-22Created from EPrint's datestamp field
- Updated
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2021-11-10Created from EPrint's last_modified field
- Caltech groups
- Division of Geological and Planetary Sciences