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Published July 1991 | public
Journal Article

Dielectric Constants of Tephroite, Fayalite and Olivine and the Oxide Additivity Rule

Abstract

The dielectric constants and dissipation factors of synthetic tephroite (Mn_2SiO_4), fayalite (Fe_3SiO_4) and a forsteritic olivine (Mg_(1.80)Fe_(0.22)SiO_4) were measured at 1 MHz using a two-terminal method and empirically determined edge corrections. The results are: tephroite, κ′_a= 8.79 tan δ_a = 0.0006 κ′_b = 10.20 tan δ_b = 0.0006 κ′_c= 8.94 tan δ_c= 0.0008 fayalite, k′_a = 8.80 tan δ_a = 0.0004 k′_b= 8.92 tan δ_b = 0.0018 k′_c = 8.58 tan δ_c = 0.0010 olivine, k′_a = 7.16 tan δ_a = 0.0006 k′_b = 7.61 tan δ_b = 0.0008 k′_c = 7.03 tan δ_c = 0.0006 The low dielectric constant and loss of the fayalite indicate an exceptionally low Fe^(3+) content. An FeO polarizability of 4.18 Å^3, determined from α_D(FeO) = [α_D(Fe_2SiO_4)-α_D(SiO_2)]/2, is probably a more reliable value for stoichiometric FeO than could be obtained from Fe_xO where x = 0.90–0.95. The agreement between measured dielectric polarizabilities as determined from the Clausius-Mosotti equation and those calculated from the sum of oxide polarizabilities according to α_D(M_2M′X4) = 2α_D(MX) + α_D(M′X_2) is ∼+2.8% for tephroite and +0.2% for olivine. The deviation from additivity in tephroite is discussed.

Additional Information

© 1991 Springer-Verlag. Received October 9, 1990. Accepted January 8, 1991. We thank O.C. Kopp, J.H. Jones, R.T. Cygan and E.K. Graham for providing the fayalite crystals. R.W. Schiffer for sample preparation, R.A. Oswald for making the capacitance measurements, A. Brown (Studsvik Energiteknik AB, Nykoping, Sweden) and C. Foris for obtaining cell dimensions, J.T. Armstrong (California Inst. Technology, Pasadena, CA) for microprobe data, A.N. Mariano for orientation of the olivine crystal, and J. Kim for assistance with the spectroscopic measurements. This work was supported in part by National Science Foundation Grant EAR-86-18200.

Additional details

Created:
August 22, 2023
Modified:
October 24, 2023