Published March 2013
| Supplemental Material
Journal Article
Open
Emergence of film-thickness- and grain-size-dependent elastic properties in nanocrystalline thin films
Abstract
Molecular dynamics simulations of nanocrystalline Ni revealed that the in-plane Young's modulus of 2.2 nm grained Ni film with ∼10 grains across its thickness was only 0.64% smaller than that of bulk, while it dropped to 24.1% below bulk value for ∼1 grain across film. This size dependence arises from the increased number of more compliant grains adjacent to the free surface. Simulations of nanocrystalline diamond revealed that the anharmonicity of the potential curve determined the sensitivity of the Young's modulus to variations in the sample size.
Additional Information
© 2012 Acta Materialia Inc. Published by Elsevier Ltd. Received 10 October 2012; accepted 23 October 2012. Available online 7 November 2012. The authors gratefully acknowledge the financial support of DARPA through the MCMA program and SWL's Kavli Nanoscience Institute post-doctoral fellowship. S.W.L. acknowledges Dr. Chris Weinberger for providing additional computing power for running simulations, and all the authors thank Dongchan Jang, Alan Jacobsen, Toby Schaedler and Bill Carter for helpful discussions.Attached Files
Supplemental Material - mmc1.pdf
Files
mmc1.pdf
Files
(323.2 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:1f8f8ee7d602a907d0908329c24c110c
|
323.2 kB | Preview Download |
Additional details
- Eprint ID
- 37068
- DOI
- 10.1016/j.scriptamat.2012.10.031
- Resolver ID
- CaltechAUTHORS:20130222-094935317
- Defense Advanced Research Projects Agency (DARPA)
- Kavli Nanoscience Institute
- Created
-
2013-02-22Created from EPrint's datestamp field
- Updated
-
2021-11-09Created from EPrint's last_modified field
- Caltech groups
- Kavli Nanoscience Institute