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Published September 1979 | Published

Journal Article Open

MeV ion scattering from thin Si single crystals: A novel approach to interface studies

Creators: Feldman, L. C.; Silverman, P. J.; Stensgaard, I.; Cheung, N.

Abstract

N/A

Additional Information

© 1979 American Vacuum Society. Received 13 September 1979. Work performed as a resident visitor at Bell Laboratories.

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Resource type: Journal Article
Publisher: American Vacuum Society
Published in: Journal of Vacuum Science and Technology, 16(5), 1457, ISSN: 0022-5355.

Created:: August 19, 2023
Modified:: October 18, 2023