Published August 2, 1982
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Testing and Structured Design
- Creators
- DeBenedictis, Erik P.
- Seitz, Charles L.
Abstract
This paper describes part of an integrated circuit testing project carried out at Caltech between 1979 and 1982. The central theme and result of the project is a language or notation for describing tests for complex integrated circuits. The evolution of this test language has been guided by many considerations, including (1) its implementation in a working, interactive test system called FIFI, (2) its fit to ideas about the architecture of high-performance test instruments, and (3) its expressivity for a design-for-testability strategy for chip designs structured in the general style presented by Mead and Conway [1].
Additional Information
Copyright (C) 1982 Caltech. All Rights Reserved. The research described in this paper was sponsored by the Defense Advanced Research Projects Agency, ARPA Order number 3771, and monitored by the Office of Naval Research under contract number N0001 4-79-C-0597. To be published in the Proceedings of the International Test Conference, Cherry Hill N.J., 1982. Caltech C.S. Deparment Document Number 4778.Files
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Additional details
- Eprint ID
- 30195
- Resolver ID
- CaltechAUTHORS:20120419-103122492
- ARPA order 3771
- Defense Advanced Research Projects Agency (DARPA)
- N00014-79-C-0597
- Office of Naval Research
- Created
-
2012-04-23Created from EPrint's datestamp field
- Updated
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2019-10-03Created from EPrint's last_modified field
- Caltech groups
- Computer Science Technical Reports
- Other Numbering System Name
- Computer Science Technical Memorandum
- Other Numbering System Identifier
- 4778