Electrical Characterization of Si Microwires and of Si Microwire/Conducting Polymer Composite Junctions

Creators: Yahyaie, Iman; McEleney, Kevin; Walter, Michael; Oliver, Derek R.; Thomson, Douglas J.; Freund, Michael S.; Lewis, Nathan S.

Abstract

The electrical (DC) behavior of single silicon microwires has been determined by the use of tungsten probes to make ohmic contact to the silicon microwires. The basic electrical properties of the microwires, such as their DC resistivity and the doping distribution along the length of the microwires, were investigated using this approach. The technique was also used to characterize the junction between silicon microwires and conducting polymers to assess the suitability of such contacts for use in a proposed artificial photosynthesis system.

Additional Information

© 2011 American Chemical Society. Received: January 28, 2011; Accepted: February 25, 2011. Financial support from the following is gratefully acknowledged: The Technology International Collaboration Fund of Manitoba Innovation Energy and Mines, the Natural Sciences and Engineering Research Council (NSERC) of Canada, the Canada Foundation for Innovation (CFI), the Manitoba Research and Innovation Fund, and the University of Manitoba. The work reported made use of the Manitoba Institute for Materials. This work was also supported by the NSF through a Center for Chemical Innovation, by the Stanford Global Trust and Energy Program, and by Toyota and made use of the Molecular Materials Research Center of the Beckman Institute at Caltech and the Kavli Nanoscience Institute at Caltech. This research was undertaken, in part, thanks to funding from the Canada Research Chairs Program.

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