Published April 2, 2010
| Published
Journal Article
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Microstructure versus Size: Mechanical Properties of Electroplated Single Crystalline Cu Nanopillars
Abstract
We report results of uniaxial compression experiments on single-crystalline Cu nanopillars with nonzero initial dislocation densities produced without focused ion beam (FIB). Remarkably, we find the same power-law size-driven strengthening as FIB-fabricated face-centered cubic micropillars. TEM analysis reveals that initial dislocation density in our FIB-less pillars and those produced by FIB are on the order of 10^(14) m^(-2) suggesting that mechanical response of nanoscale crystals is a stronger function of initial microstructure than of size regardless of fabrication method.
Additional Information
© 2010 The American Physical Society. Received 18 January 2010; published 1 April 2010. We thank D. Jang for assistance in TEM operation and sample preparation and also B. Van Leer and L. A. Giannuzzi (FEI Company, Hillsboro, OR, USA) for assistance with TEM sample preparation. The authors gratefully acknowledge Kavli Nanoscience Institute at Caltech and financial support from the National Science Foundation through NSF CAREER Grant (DMR-0748267).Attached Files
Published - Jennings2010p9876Phys_Rev_Lett.pdf
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Jennings2010p9876Phys_Rev_Lett.pdf
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Additional details
- Eprint ID
- 18448
- Resolver ID
- CaltechAUTHORS:20100526-084624542
- DMR-0748267
- NSF
- Created
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2010-06-01Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field