Welcome to the new version of CaltechAUTHORS. Login is currently restricted to library staff. If you notice any issues, please email coda@library.caltech.edu
Published March 8, 2010 | Published
Journal Article Open

Thin film dielectric microstrip kinetic inductance detectors

Abstract

Microwave kinetic inductance detectors, or MKIDs, are a type of low temperature detector that exhibit intrinsic frequency domain multiplexing at microwave frequencies. We present the first theory and measurements on a MKID based on a microstrip transmission line resonator. A complete characterization of the dielectric loss and noise properties of these resonators is performed, and agrees well with the derived theory. A competitive noise equivalent power of 5×10^(−17) W Hz^(−1/2) at 10 Hz has been demonstrated. The resonators exhibit the highest quality factors known in a microstrip resonator with a deposited thin film dielectric.

Additional Information

© 2010 American Institute of Physics. Received 7 October 2009; accepted 21 January 2010; published online 8 March 2010. This material is based upon work supported by the National Aeronautics and Space Administration under Grant No. NNH06ZDA001N-APRA2 issued through the Science Mission Directorate. The authors would like to thank John Martinis, Sunil Golwala, and Andrew Cleland for useful insights.

Attached Files

Published - Mazin2010p7432Appl_Phys_Lett.pdf

Files

Mazin2010p7432Appl_Phys_Lett.pdf
Files (170.5 kB)
Name Size Download all
md5:be81adc74e986dce150aaa6285663731
170.5 kB Preview Download

Additional details

Created:
August 19, 2023
Modified:
March 5, 2024