Characterizing entanglement sources
- Creators
- Lougovski, Pavel
- van Enk, S. J.
Abstract
We discuss how to characterize entanglement sources with finite sets of measurements. The measurements do not have to be tomographically complete and may consist of POVMs rather than von Neumann measurements. Our method yields a probability that the source generates an entangled state as well as estimates of any desired calculable entanglement measures, including their error bars. We apply two criteria, namely, Akaike's information criterion and the Bayesian information criterion, to compare and assess different models (with different numbers of parameters) describing entanglement-generating devices. We discuss differences between standard entanglement-verification methods and our present method of characterizing an entanglement source.
Additional Information
© 2009 The American Physical Society. Received 3 August 2009; published 18 November 2009. S.J.v.E. thanks Robin Blume-Kohout for many useful and inspiring discussions. This research is supported by the Disruptive Technologies Office (DTO) of the DNI.Attached Files
Published - Lougovski2009p6639Phys_Rev_A.pdf
Files
Name | Size | Download all |
---|---|---|
md5:b876fb11e9ce7fdf15e46534c9c6581d
|
233.5 kB | Preview Download |
Additional details
- Eprint ID
- 17059
- Resolver ID
- CaltechAUTHORS:20100105-110118396
- Disruptive Technologies Office (DTO) of the DNI
- Created
-
2010-01-05Created from EPrint's datestamp field
- Updated
-
2021-11-08Created from EPrint's last_modified field