Published October 1, 2009
| Published
Journal Article
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Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities
- Creators
- Chueh, William C.
-
Haile, Sossina M.
Abstract
Small polaron carrier density in epitaxial, doped CeO_2 thin films under low oxygen partial pressure was determined from electrochemically-measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.
Additional Information
This journal is © the Owner Societies 2009. Received 3rd June 2009, Accepted 14th July 2009. First published as an Advance Article on the web 27th July 2009. The authors gratefully acknowledge the National Science Foundation (DMR-0604004) for funding and Dr Youli Li at the University of California, Santa Barbara for assistance with thin film X-ray diffraction experiments.Attached Files
Published - Chueh2009p5948Physical_chemistry_chemical_physics_PCCP.pdf
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Chueh2009p5948Physical_chemistry_chemical_physics_PCCP.pdf
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Additional details
- Eprint ID
- 16052
- Resolver ID
- CaltechAUTHORS:20090925-095034779
- DMR-0604004
- NSF
- Created
-
2009-10-05Created from EPrint's datestamp field
- Updated
-
2021-11-08Created from EPrint's last_modified field